HP83000 test Information

Tester Specifications

  • 383 pin 120/330Mhz Digital

  •  Multi Site Capability

  •  Direct dock for Wafer Probe

  •  8 power supplies and PMU per pin

  •  +/-150ps accuracy

  •  8 Meg Pattern Depth

  •  Algorithmic Pattern Generator

  •  Mixed Signal Capabilities
Targeted Technology
  •  High pin count and high speed requirements
  •  Digital, Memories, Processors & Microcontrollers
  •  Mixed Signal VLSI, ASIC and FPGAs
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